S. Kumar and A. Mukherjee,"Design of soft-error resilient SRAM cell with high read and write stability for robust operations", AEU - International Journal of Electronics and Communications, vol.168, no.154719, pp.1-10, Elsevier, August 2023, 10.1016/j.aeue.2023.154719       Article

Md. B. Arshad and A. Mukherjee,"Comparative Analysis of Deep Learning Models for the Detection of Epileptic Seizure", American Journal of Advanced Computing, vol.2, no.1, pp.29-35, Society for Makers, Artists, Researchers and Technologists 2023, 10.15864/ajac.21016       Article

S. Kumar and A. Mukherjee,"High performance radiation-hardened SRAM cell design for robust applications", Microelectronics Journal, vol.140, no.105934, pp.1-12, Elsevier, October 2023, 10.1016/j.mejo.2023.105934       Article

A. K. Samal, S. Kumar, and A. Mukherjee,"Design of Single Node Upset Resilient Latch for Low Power, Low Cost and Highly Robust Applications", in IEEE International Test Conference in Asia (ITC-Asia), pp.1-5, IEEE, Matsue, Japan 2023, 10.1109/ITC-Asia58802.2023.10301176       Inproceedings

A. Gon and A. Mukherjee,"Design of hardware-efficient PVC recognition and classification system for early detection of sudden cardiac arrests", AEU - International Journal of Electronics and Communications, vol.172, no.154955, pp.1-13, Elsevier, December 2023, 10.1016/j.aeue.2023.154955       Article

K. Sahu and A. Mukherjee,"Design of a Self-reconfigurable Incrementer for Fault Tolerant VLSI Architecture", in IEEE Silchar Subsection Conference (SILCON), pp.1-5, IEEE, Silchar, India 2023, https://doi.org/10.1109/SILCON59133.2023.10405199       Inproceedings

A. Mukherjee,"VLSI Architecture Design of Motion Estimation Block with Hexagon-Diamond Search Pattern for Real-Time Video Processing", in IEEE 18th India Council International Conference (INDICON), pp.1-6, IEEE, February 2022, 10.1109/INDICON52576.2021.9691531       Inproceedings

S. Kumar and A. Mukherjee,"A triple-node upset self-healing latch for high speed and robust operation in radiation-prone harsh-environment", Microelectronics Reliability, vol.139, no.114857, pp.1-12, Elsevier, December 2022, 10.1016/j.microrel.2022.114857       Article

S. Kumar and A. Mukherjee,"A Highly Robust and Low-Power Real-Time Double Node Upset Self-Healing Latch for Radiation-Prone Applications", IEEE Transactions on Very Large Scale Integration (VLSI) Systems, vol.29, no.12, pp.2076-2085, IEEE 2021, 10.1109/TVLSI.2021.3110135       Article

S. Kumar and A. Mukherjee,"A Self-Healing, High Performance and Low-Cost Radiation Hardened Latch Design", in IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), pp.1-6, IEEE, October 2021, 10.1109/DFT52944.2021.9568359       Inproceedings