National Institute of Technology Rourkela

राष्ट्रीय प्रौद्योगिकी संस्थान राउरकेला

ଜାତୀୟ ପ୍ରଯୁକ୍ତି ପ୍ରତିଷ୍ଠାନ ରାଉରକେଲା

An Institute of National Importance

Syllabus

Course Details

Subject {L-T-P / C} : EE6152 : Pattern Recognition { 3-0-0 / 3}

Subject Nature : Theory

Coordinator : Prof. Dipti Patra

Syllabus

Pattern Recognition: Feature Extraction and classification stages, Different approaches to pattern recognition. Statistical Pattern Recognition : Hypothesis testing, Linear classifiers, Parametric and nonparametric classification techniques, Unsupervised learning and clustering, Syntactic pattern recognition, Fuzzy set Theoretic approach to PR, Applications of PR : Speech and speaker recognition, Character recognition, Scene analysis.

Course Objectives

  • Provide knowledge of models, methods and tools used to solve regression, <br />classification, feature selection and density estimation problems
  • Provide knowledge of current research topics and issues in Pattern Recognition and <br />Machine Learning
  • Provide hands-on experience in analyzing and developing solutions/algorithms <br />capable of learning

Course Outcomes

• Explain and compare a variety of pattern classification, structural pattern recognition techniques. <br />• Apply performance evaluation methods for pattern recognition, and critique comparisons of techniques made in the research literature. <br />• Apply pattern recognition techniques to real-world problems. <br />• Implement simple pattern classifiers, classifier combinations, and structural pattern recognizers.

Essential Reading

  • Peter E. Hart, Richard O. Duda, David G. Stork, Pattern Classification, Wiley
  • Christopher Bishop, Pattern Recognition & Machine Learning, Springer

Supplementary Reading

  • T.Y. Young & King-Sun Fu, Handbook of Pattern Recognition & Image Processing, Academic Press
  • Peebles, Peyton Z, Probability, Random Variables & Random Signal Principles, McGraw-Hill

Journal and Conferences

  • IEEE Transaction on Pattern Analysis and Machine Intelligence, IEEE conference on Computer Vision & Pattern Recognition
  • Elsevier Journal on Pattern Recognition