Course Details

Subject {L-T-P / C} : CR6134 : Electron Microscopy { 3-0-0 / 3}

Subject Nature : Theory

Coordinator : Prof. Arindam Paul

Syllabus

Microscopy with light and electrons: Reyleigh resolution limit, depth of field, Basics of scanning electron microscopy: the instrument and controls, deflection systems, electron detectors (Everhart-Thornley) Electron guns: tungsten hairpin source, emission current and beam current and effect of bias voltage, LaB6 sources, field emission sources, brightness and probe current electron lenses and electron optics: condenser, objective lens, demagnification of the beam, effect of final aperture size, working distance and condenser lens strength on the final probe size lens aberrations high depth-of-field image, high resolution image, high beam current image, low-voltage mode basics of elastic and inelastic scattering, interaction volume, influence of beam, specimen parameters and surface tilt on the interaction volume, Kanaya-Okayama range for electron penetration depth, dependence of atomic number, beam energy on backscattered and secondary electrons, quantitative X-ray spectrometry, ZAF corrections, basics of electron diffraction, diffraction spot pattern and analysis, reciprocal lattice, Ewald sphere, diffraction from a finite crystal, kikuchi line pattern, convergent beam electron diffraction pattern, the transmission electron microscope: basics of instrumentation, the electron gun, lenses and apertures, capabilities, limitations, modern trends Mass-thickness contrast, kinematical and dynamical contrast.

Course Objectives

Course Outcomes

Knowledge on Electron Microscopy

Essential Reading

Supplementary Reading

Journal and Conferences