Course Details
Subject {L-T-P / C} : MM6523 : Experimental Techniques in Materials Engineering { 3-0-0 / 3}
Subject Nature : Theory
Coordinator : Prof. Santosh Kumar Sahoo
Syllabus
X-ray and diffraction: Characterization of x-rays, absorption, x-ray diffraction techniques, interpretation of diffraction data, qualitative and quantitative phase analysis, analysis of particle size, residual stress/strain, phase diagram determination, order-disorder transformation study. X-ray fluorescence: Origin, basic theory/concept, characterization of materials through x-ray fluorescence. Electron microscopy: TEM & SEM, construction, different components & their functions, aberration of electron lenses, image formation, magnification, resolution, depth of field & depth of focus etc. Bright field & dark field image, SAD diffraction, kikuchi pattern, CBED, etc. elemental analysis through WDS & EDS: Principle, application for analytical studies. Thermal analysis techniques: Thermo gravimetric analysis, differential thermal analysis and differential scanning calorimetry, the basis, instrumentation, data acquisition and interpretation of analytical results.
Course Objectives
- 1. Application of XRD technique to determine crystal structure, lattice parameter, crystallite size, lattice strain, residual stress, and order-disorder transformation.
- 2. Microstructural characterization through SEM and TEM.
- 3. Elemental analysis through EDS and WDS.
- 4. Characterization of phase transformation through thermal analysis techniques.
Course Outcomes
CO1: Analysis of different phases in a material. <br />CO2: Analysis of crystallite size (grain size) and lattice strain in a material. <br />CO3: Analysis of chemical composition of a material. <br />CO4: Analysis of phase transformation in a material.
Essential Reading
- B. D. Cullity and S. R. Stock, Elements of X – Ray Diffraction, Prentice-Hall, New Jersy, 2001
- P.J. Goodhow, J. Humbreys & R. Beanland,, Electron Microscopy & Analysis, Taylor & Francis Publ.
Supplementary Reading
- 2. C. Suryanarayana and M. Grant Norton, X-ray Diffraction A Practical Approach, Springer
- 3. David B. Williams and C. Barry Carter, Transimission Electron Microscopy A Textbook for Materials Science, Springer
Journal and Conferences
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