Course Details
Subject {L-T-P / C} : CH6233 : Principles of Analytical and Characterization Instruments { 3-0-0 / 3}
Subject Nature : Theory
Coordinator : Dr. Biswajit Saha
Syllabus
Crystallography: Introduction Lattice structure, Unit cells Miller indices Symmetry operation
XRD: X-ray diffraction theory Bragg’s Law X-ray powder diffraction Intensity controlling factors Instrumentation, Sample preparation Source of error Application of XRD
XPS: Theory of binding energy XPS background Peak split Peak shift Chemical analysis Quantitative analysis Contamination removal technique Surface charging Applications Depth profiling Composition mapping Instrumentation Sample preparation
SEM-EDS: Characteristic information Resolution Magnification Working distance Exercise, Instrumentation Challenges Charging Electron trajectory and interaction volume Theory Qualitative analysis EDS instrumentation Case study
STM-AFM: Tunneling Phenomenon Atomic resolution of STM Basic component Capability and limitation Operation modes, Principle of operation Detector force-displacement relationship Chemical mapping,
Course Objectives
- Analytical instruments are very much essential in chemical related industry and research institutes to analyze chemicals and characterize products. The chemical engineering students should not only learn to apply and interpret the data generated with these techniques but also they must learn to operate instruments and design measurement protocols for the systems being studied. Significant understanding on both analytical and materials characterization instruments will develop such skills among the chemical or materials scientists/engineers.
Course Outcomes
Course Outcomes: <br />CO1: Gain knowledge on the operational principles of the instruments. <br />CO2: Develop in-depth understanding of instrument handling techniques, material properties and instrument selections criteria for various research fields <br />CO3: Learn analysis of data and interpretation of results <br />CO4: Develop Knowledge on sample processing, limitations and precaution
Essential Reading
- Sam Zhang, Lin Li Ashok Kumar, 1. Materials Characterization Techniques, CRC Press , 2008
- Yang Leng, John, 2. Materials Characterization: Introduction to Microscopic and Spectroscopic Methods, Wiley & Sons , 2009
Supplementary Reading
- Egerton, Ray, 3. Physical Principles of Electron Microscopy: Introduction to TEM, SEM, and AEM, Springer , 2005
- R S Khandpur, Handbook of Analytical Instruments, Tata McGraw-Hill , 2006