Course Details
Subject {L-T-P / C} : MM4512 : Materials Characterization Techniques { 3-0-0 / 3}
Subject Nature : Theory
Coordinator : Prof. Debasis Chaira
Syllabus
Optical Microscopy and Image analyzer: Understanding of image formation, resolution, numerical aperture, magnification, depth of field and depth of focus of a microscope. Quantitative and phase analysis (inclusion, size distribution etc.).
X-ray diffraction and analysis: Production and properties of X-rays, X-ray diffraction, Structure factor and intensity calculations. Effect of texture, particle size, micro strain on diffraction lines. Indexing of powder photographs. X-rays florescence: basics and applications in materials science.
SEM and FESEM: Principle and applications, Modes of operation, Image formation - plane and fractured surfaces. Microanalysis (EDX, WDS etc.) TEM: Principle and operation. Bright field and dark field images, Sample preparation techniques. Selected area diffraction, Reciprocal lattice and Ewald sphere construction, Indexing of selected area diffraction patterns. Advanced Characterization Techniques: STEM, AFM, Nanoindentation Testing, EELS- Principle and applications.
DTA/DSC-TG: Scope and applications in materials science.
Course Objectives
- To have an idea about qualitative and quantitative phase analysis of materials
- To have an idea about microstructural characterization of materials
- To gain knowledge on thermal characterization of materials
Course Outcomes
CO1: To have an idea of X-Ray diffraction as a materials characterization technique <br />CO2: To learn microstructural characterization of materials using microscopy <br />CO3: To have an idea of elemental chemical composition analysis using EDS and WDS <br />CO4: To learn about basic principles and applications of optical and electron microscopy <br />CO5: To learn various sample preparation techniques of SEM and TEM <br />CO6: To gain knowledge of thermal analysis techniques
Essential Reading
- B.D. Cullity, Elements of X-ray Diffraction, Addison-Wesley Publishing Co. Reading, USA
- P. J. Goodhew and F. J. Humphreys, Electron Microscopy and Analysis, Taylor and Francis
Supplementary Reading
- Robert Speyer, Thermal analysis of materials, CRC Press
- C. Suryanarayana and M. Norton, X-ray Diffraction, A Practical Approach, Plenum Press, New York