Course Details
Subject {L-T-P / C} : CR0005 : Ceramic testing and characterization { 3-0-0 / 3}
Subject Nature : Theory
Coordinator : Prof. Bibhuti Bhusan Nayak
Syllabus
Thermal analysis methods- principles, instrumentation, data analysis and applications in ceramics X-ray diffraction and Bragg Law, Diffraction under ideal and non-ideal condition, X-ray scattering and structure factor, X-ray diffractometer, X-ray data file analysis, Chemical analysis by x-ray fluorescence, Auger Electron Spectroscopy, X-ray Photoelectron Spectroscopy, Electron loss energy spectroscopy Scanning Electron Microscopy – basic principle, instrumentation, electron specimen interaction, topographical and atomic number contrast. Transmission Electron Microscopy practical aspect of microscopy, amplitude and phase contrast imaging, kinematical theory of image contrast, electron diffraction. Atomic Force Microscopy- basic principles, Atomic Force Microscopy modes, phase imaging, face curve, application of Atomic Force Microscopy Infrared, Raman and Nuclear magnetic resonance spectroscopy: field ion microscopy, Basic principles, Instrumentation, Infrared and Raman active bonds, data analysis, applications, surface analysis and chromatography techniques for material characterization.
Course Objectives
- To learn about the basic principles of different instruments used for thermal, structural and microstructural analysis of materials.
- To analyse the data obtained DTA, DSC, TG, Dilatometer, XRD, SEM and TEM.
Course Outcomes
To design, conduct experiments, and interpret, analyse data.
Essential Reading
- R. F. Speyer, Thermal Analysis of Materials, CRC Press , 1994
- B. D. Cullity, Elements of X-ray Diffraction, Addison Wesley Publishing Company , 1978
Supplementary Reading
- P.J. Goodhew, J. Humphreys and R. Beanland, Electron Microscopy and Analysis, Taylor & Francis , 2001
- D. A. Skoog, F. J. Holler and T. A. Nieman, Principles of Instrumental Analysis, Hartcourt College Publishers , 1998