National Institute of Technology Rourkela

राष्ट्रीय प्रौद्योगिकी संस्थान राउरकेला

ଜାତୀୟ ପ୍ରଯୁକ୍ତି ପ୍ରତିଷ୍ଠାନ ରାଉରକେଲା

An Institute of National Importance

Syllabus

Course Details

Subject {L-T-P / C} : CR3203 : Instrumental Characterization Laboratory { 0-0-3 / 2}

Subject Nature : Practical

Coordinator : Prof. Bibhuti Bhusan Nayak

Syllabus

1. Principle and operation of DTA/DSC, TGA, Dilatometer, XRD, SEM/FESEM, optical microscopy, UV-Visible, BET, Particle size and Zeta potential.
2. Study of thermal decomposition behavior of dolomite /clay.
3. DSC-TG behavior of ceramic samples.
4. Effect of particle size and heating rate on DTA/DSC/TGA curves.
5. Thermal expansion behavior and determination of thermal expansion coefficient of ceramic samples.
6. Study of amorphous, crystalline, cubic, tetragonal, and monoclinic phase using XRD.
7. Data analysis of an X-ray profile.
8. Determination of crystallite size, lattice parameter, strain and phase analysis using XRD.
9. Image analysis of optical and SEM/FESM.
10. Determination of particle size and zeta potential.
11. Determination of surface area and pore size distribution using BET.
12. Study of UV-Visible spectrum of ceramic powder samples.

Course Objectives

  • To learn about the basic principles of different instruments.
  • To analyze data obtained from different analysis.
  • To explore the analysis in different field of research and applications.
  • The course modules are structured in such a way that it would immensely help students aspiring for higher studies

Course Outcomes

CO1: Students will gain knowledge on the basic principles of different instruments. <br />CO2: Able to design, conduct experiments, and interpret / analyze data. <br />CO3: Apply the theoretical knowledge imparted during the course to carry out characterization of materials for independent research and developmental work. <br />CO4: Able to independently formulate and solve problems as leader/ team member.

Essential Reading

  • R. F. Speyer, Thermal Analysis of Materials, CRC Press , 1994
  • B. D. Cullity, Elements of X-ray Diffraction, Addison Wesley Publishing Company , 1978

Supplementary Reading

  • P.J. Goodhew, J. Humphreys and R. Beanland, Electron Microscopy and Analysis, Taylor & Francis , 2001
  • D. A. Skoog, F. J. Holler and T. A. Nieman, Principles of Instrumental Analysis, Hartcourt College Publishers , 1998