National Institute of Technology Rourkela

राष्ट्रीय प्रौद्योगिकी संस्थान राउरकेला

ଜାତୀୟ ପ୍ରଯୁକ୍ତି ପ୍ରତିଷ୍ଠାନ ରାଉରକେଲା

An Institute of National Importance

All Publications

Sambit Bakshi

Assistant Professor Grade-I
bakshisambit@nitrkl.ac.in

A. Khalid, Z. Mushtaq, S. Arif, K. Zeb, M. A. Khan, and S. Bakshi,"Control schemes for quadrotor UAV: Taxonomy and survey", ACM Computing Surveys, vol.56, no.5, pp.1-32, ACM 2024, 10.1145/3617652       Article
N. Banerjee, S. Bakshi, and P. K. Sa,"DNA sequence similarity for identifying mastitis-causing bacteria in cattle", in International Conference on Computational Intelligence in Pattern Recognition, Springer, cipr-2024, Baripada, India, March 2024       Inproceedings
J. Bakas, R. Naskar, M. Nappi, and S. Bakshi,"Object-based forgery detection in surveillance video using capsule network", Journal of Ambient Intelligence and Humanized Computing, vol.14, pp.3781-3791, Springer 2023, 10.1007/s12652-021-03511-3       Article
A. Nanda, Ram. C. Barik, and S. Bakshi,"SSO-RBNN driven brain tumor classification with Saliency-K-means segmentation technique", Biomedical Signal Processing and Control, vol.81, no.104356, Elsevier 2023, 10.1016/j.bspc.2022.104356       Article
K. K. Jena, S. K. Bhoi, S. Mohapatra, and S. Bakshi,"Hybrid deep learning approach for classification of music genres using wavelet and spectrogram analysis", Neural Computing and Applications, vol.35, pp.11223-11248, Springer 2023, 10.1007/s00521-023-08294-6       Article
G. Kumar, S. Bakshi, A. K. Sangaiah, and P. K. Sa,"Experimental evaluation of covariates effects on periocular biometrics: A robust security assessment framework", Journal of Data and Information Quality, vol.15, no.2, pp.1-25, ACM 2023, 10.1145/3579029       Article
C. Swain, M. N. Sahoo, A. Satpathy, K. Muhammad, S. Bakshi, and J.,"A-DAFTO: Artificial Cap Deferred Acceptance based Fair Task Offloading in Complex IoT-Fog Networks", IEEE Transactions on Consumer Electronics, IEEE 2023, 10.1109/TCE.2023.3262995       Article
S. Devi, M. N. Sahoo, and S. Bakshi,"Explainable Reverse Verification of Goodness of Classification of MRI Images by Clinical Experts", IEEE Journal of Biomedical and Health Informatics, IEEE, May 2023, 10.1109/JBHI.2023.3280184       Article
T. K. Behera, S. Bakshi, M. Nappi, and P. K. Sa,"Superpixel-based multiscale CNN approach towards multiclass object segmentation from UAV-captured aerial images", IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing, vol.16, pp.1771 - 1784, IEEE 2023, 10.1109/JSTARS.2023.3239119       Article
T. K. Behera, S. Bakshi, and P. K. Sa,"A lightweight deep learning architecture for vegetation segmentation using UAV-captured aerial images", Sustainable Computing: Informatics and Systems, vol.37, pp.100841, Elsevier 2023, 10.1016/j.suscom.2022.100841       Article