Course Details
Subject {L-T-P / C} : PH6573 : Semiconductor Materials Characterization Laboratory { 0-0-3 / 2}
Subject Nature : Practical
Coordinator : Jyoti Prakash Kar
Syllabus
| Module 1 : |
To estimate the crystal structure, and lattice parameters of a given semiconducting material using X-ray diffraction technique. [Software: Rietveld refinement by FullProf software] |
| Module 2 : |
To determine (i) the composition of a semiconducting material surfaces (elemental identification and (ii) the chemical state of polyvalent ions by measuring the binding energies of elements |
| Module 3 : |
To study the chemical structure, phase, polymorphism, crystallinity, and molecular interactions of a given semiconducting material using Raman spectroscopy
|
| Module 4 : |
To (i) study surface/interface morphology using scanning electron microscopy (SEM) high-resolution images, (ii) determine elemental composition employing energy dispersive X-ray spectroscopy (EDS) |
| Module 5 : |
To measures surface topography at the nanometer scale using atomic force microscopy (AFM) |
| Module 6 : |
To visualize, inspect, quantify, and validate scientific image data using ImageJ software |
| Module 7 : |
To measure the work function and surface potential of a given semiconducting materials using Kelvin probe force microscopy |
| Module 8 : |
To calculate the charge density in a metal-oxide-semiconductor (MOS) structure using capacitance-voltage (C-V) measurements |
| Module 9 : |
To study the current-voltage (I-V) characteristics of a metal-oxide-semiconductor (MOS) structure |
| Module 10 : |
To calculate the mobility, carrier concentration of given semiconductor by Hall probe measurement system |
| Module 11 : |
Current-time (I-t) measurements of photodetector and chemical sensors |
Course Objective
| 1 . |
To impart knowledge on analysis of experimental data, interpreting results, and understanding how different characterization methods correlate with material properties |
| 2 . |
Fundamental electronic, optical, and structural properties of semiconductor materials through practical experiments |
| 3 . |
Execution, and troubleshooting of experiments related to semiconductor materials and devices |
| 4 . |
Advanced research and development activities in the field of semiconductor technology by providing a solid foundation in characterization techniques |
Course Outcome
| 1 . |
At the end of course, students will be able to develop strong research skills, including the ability to design experiments, solve practical problems, and conduct scientific investigations with a clear understanding of the methodologies involved |
| 2 . |
Troubleshoot and adapt experimental procedures to address challenges and improve accuracy |
| 3 . |
Execute experiments meticulously, document procedures, and ensure data integrity |
Essential Reading
| 1 . |
Laboratory Manual, Laboratory Manual, Laboratory Manual , Laboratory Manual |
| 2 . |
Y. Leng, Materials Characterization: Introduction to Microscopic and Spectroscopic Methods, Wiley-VCH , (2013) |
Supplementary Reading
| 1 . |
C. Suryanarayana, M. Grant Norton, X-Ray Diffraction: A Practical Approach, Springer , (2014) |
Journal and Conferences
| 1 . |