Syllabus

Microscopy with light and electrons: Reyleigh resolution limit, depth of field, Basics of scanning electron microscopy: the instrument and controls, deflection systems, electron detectors (Everhart-Thornley) Electron guns: tungsten hairpin source, emission current and beam current and effect of bias voltage, LaB6 sources, field emission sources, brightness and probe current electron lenses and electron optics: condenser, objective lens, demagnification of the beam, effect of final aperture size, working distance and condenser lens strength on the final probe size lens aberrations high depth-of-field image, high resolution image, high beam current image, low-voltage mode basics of elastic and inelastic scattering, interaction volume, influence of beam, specimen parameters and surface tilt on the interaction volume, Kanaya-Okayama range for electron penetration depth, dependence of atomic number, beam energy on backscattered and secondary electrons, quantitative X-ray spectrometry, ZAF corrections, basics of electron diffraction, diffraction spot pattern and analysis, reciprocal lattice, Ewald sphere, diffraction from a finite crystal, kikuchi line pattern, convergent beam electron diffraction pattern, the transmission electron microscope: basics of instrumentation, the electron gun, lenses and apertures, capabilities, limitations, modern trends Mass-thickness contrast, kinematical and dynamical contrast.

Understanding electron microscopy principles

Proficiency in sample preparation techniques

Interpreting electron microscopy images

Applying electron microscopy to research and problem solving

Fundamental understanding of principles of operation of SEM, TEM and interpretation of images and
diffraction patterns.

At the end of the course, students will be able to demonstrate proficiency in preparing samples for electron microscopy by selecting appropriate preparation methods (mechanical, chemical, and ion-beam based), minimizing artifacts, and ensuring specimen quality suitable for high-resolution imaging and analysis.

At the end of the course, students will be able to interpret electron microscopy images by analyzing contrast mechanisms, identifying microstructural features, and correlating image information with material properties.

At the end of the course, students will be able to apply electron microscopy techniques to address research questions and solve practical problems in materials characterization by designing suitable experimental strategies, acquiring relevant data, and drawing scientifically valid conclusions.

J. Goldstein, ., Scanning Electron Microscopy and X-ray Microanalysis, 3rd Edition,, Springer,2003

P J Goodhew, J Humphreys, R Beanland,, Electron Microscopy and Analysis, 3rd Edition,, Taylor and Francis, 2001.

D B Williams, C. B. Carter,, Transmission Electron Microscopy: A Textbook for Materials Science, 2nd Edition,, Springer, 2009