Syllabus

Module 1: Thermal analysis (TG, DTA, DSC, Dilatometer): Thermal analysis methods- principles, instrumentation, data analysis, factors affecting thermal analysis curves, and applications in ceramics, derivative thermogravimetry, self-generated thermogravimetry, thermo dilatometry.
12 Hours

Module 2: X-Ray Diffraction: Properties of X-Rays, X-ray diffraction and Bragg Law, Diffraction direction and diffraction methods, Diffraction under non-ideal condition, X-ray scattering and structure factor, powder photographs, Debye-Scherrer method, X-ray diffractometer, X-ray data file analysis, indexing pattern of cubic crystals. Auger Electron Spectroscopy.

12 Hours

Module 3: Infra-red spectroscopy- molecular vibrations, instrumentation, data analysis, applications. UV Visible spectroscopy- principle, electronic transition, applications.

4 Hours

Module 4: Scanning Electron Microscopy – basic principle, instrumentation, electron specimen interaction, Secondary and back-scattered electrons, topographical and atomic number contrast. Particle size analysis, Surface area and porosity – basic principle and data analysis

10 Hours

To provide in-depth knowledge of various instrumental techniques used for ceramic materials characterization.

To learn about the basic principles of different instruments used for thermal, structural and microstructural analysis of materials.

To analyze the data obtained from DTA, DSC, TG, Dilatometer, FTIR, XRD, SEM and TEM.

CO1: Students will gain knowledge on ceramic characterization techniques used by academic institutes and industries.
CO2: Apply the theoretical knowledge imparted during course to carry out independent research and developmental work related to characterization of ceramic materials.
CO3: Prepare future materials scientist and engineers who can fit in academia and industry for relevant scientific breakthrough.
CO4: Able to design, conducts experiments, and interpret or analyse data.

R. F. Speyer,, Thermal Analysis of Materials,, Marcel Dekker Inc., 1994.

B. D. Cullity,, Elements of X-ray Diffraction,, Addison Wesley Publishing Company 2nd edition,1978.

Wesley WM. Wendlandt,, Thermal Analysis Third Edison, John Wiley and Sons

H. P. Klug and L. E. Alexander,, X-ray Diffraction procedures for Polycrystalline and Amorphous Materials, 2nd Edition,, John Wiley, 1974.