National Institute of Technology Rourkela

राष्ट्रीय प्रौद्योगिकी संस्थान राउरकेला

ଜାତୀୟ ପ୍ରଯୁକ୍ତି ପ୍ରତିଷ୍ଠାନ ରାଉରକେଲା

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Syllabus

Course Details

Subject {L-T-P / C} : CH6233 : Principles of Analytical and Characterization Instruments { 3-0-0 / 3}

Subject Nature : Theory

Coordinator : Santanu Paria

Syllabus

Module 1 :

Module I
Introduction to different characterization and analytical instruments.
Spectroscopy: UV-Vis Spectroscopy.
Module II
Chromatography: Gas chromatography (GC), High performance liquid chromatography (HPLC).
Module III
Microscopy: Optical microscopy.
Module IV
Microscopy: Electron microscopy, Scanning electron microscopy (SEM/FE-SEM) and Transmission electron microscopy (TEM).
Module V
X-Ray spectroscopy: X-ray Photo-electron Spectroscopy (XPS)

Course Objective

1 .

To understand the working principles of the different instruments

2 .

To develop knowledge of analyzing experimental data from different instruments

3 .

To develop knowledge on the designing of experimental protocols for instrumental analysis

Course Outcome

1 .

Course Outcomes:
CO1: To gain knowledge on the operational principles of the instruments.
CO2: To develop in-depth understanding of instrument handling techniques, material properties and instrument selections criteria for various research fields
CO3: To learn analysis of data and interpretation of results
CO4: To develop Knowledge on sample processing, limitations and precaution

Essential Reading

1 .

Sam Zhang, Lin Li Ashok Kumar, 1. Materials Characterization Techniques, CRC Press , 2008

2 .

Yang Leng, John, 2. Materials Characterization: Introduction to Microscopic and Spectroscopic Methods, Wiley & Sons , 2009

Supplementary Reading

1 .

Egerton, Ray, 3. Physical Principles of Electron Microscopy: Introduction to TEM, SEM, and AEM, Springer , 2005

2 .

R S Khandpur, Handbook of Analytical Instruments, Tata McGraw-Hill , 2006