Syllabus

(3 hrs) Introduction: Importance of material characterization techniques, Probes for characterization, Basic principles of measurement and instrumentation, Measurements & error analysis, Uncertainty of measurements, Types of errors

(4 hrs) Structural Characterization Techniques: X-ray Diffraction (XRD), Small angle neutron and x-ray scattering, Scanning Electron Microscopy (SEM), Transmission Electron Microscopy (TEM)

(5 hrs) Morphological and Compositional Analysis: Atomic Force Microscopy (AFM), Scanning Tunneling Microscopy (STM), Energy Dispersive X-ray Spectroscopy (EDX), X-ray Photoelectron Spectroscopy (XPS)

(6 hrs) Optical and Spectroscopic Characterization: UV Spectroscopy, Photoluminescence Spectroscopy (PL), Fourier Transform Infrared Spectroscopy (FTIR), Raman Spectroscopy, Ellipsometry, Rutherford back scattering (RBS)

(6 hrs) Electrical and Thermal Characterization Techniques: Hall Effect, Four-point probe method, Thermogravimetric Analysis (TGA), Differential Scanning Calorimetry (DSC), Dielectric and Impedance Spectroscopy, Thermal conductivity, Thermal expansion, Specific heat capacity

To impart knowledge on
Introducing fundamental principles and techniques used in characterizing materials.

2. To provide an understanding of structural, morphological, optical, electrical, and thermal characterization techniques.

3. Understanding working principles, advantages, and limitations of different material characterization tools.

4. Developing skills in selecting appropriate characterization techniques for different material systems

At the end of course, students will be able to:
CO1: Understand fundamental principles behind different material characterization techniques.

CO2: Understand selecting appropriate characterization methods based on the material type and required properties.

CO3: Analyze data and errors to evaluate the quality of materials.

CO4: Evaluate structural, morphological, optical, electrical, and thermal properties of different materials.

CO5:The spectroscopic and other physical properties are analysed with detailed data analysis.

Y. Leng, Wiley , Materials Characterization: Introduction to Microscopic and Spectroscopic Methods, NA (2013)

S. Zhang, L. Li and A. Kumar, Materials Characterization Techniques, CRC Press (2008)

M. Sayer, A. Mansingh,, Measurement, Instrumentation and Experiment Design in Physics and Engineering, Prentice Hall India Learning Private Limited (1999)

D. Williams and C. Carter, , Transmission Electron Microscopy: A Textbook for Materials Science, Springer (2009)

S.J. Pennycook & P.D. Nellist, Scanning Transmission Electron Microscopy, Springer (2011)

B.D. Cullity and S.R. Stock, Elements of X-ray Diffraction, Pearson (2001)