Course Details
Subject {L-T-P / C} : PH3080 : Semiconductor and Nanostructure Laboratory { 0-0-3 / 2}
Subject Nature : Practical
Syllabus
| Module 1 : |
(i) Demonstration of microelectronic devices, MEMS and single nanowire based device on silicon wafer
|
| Module 2 : |
Measurement of resistivity and mobility of a given semiconductor |
| Module 3 : |
Calculation of barrier height and ideality factor of metal-semiconductor Schottky contacts with rise in temperature |
| Module 4 : |
Measurement of threshold voltage and reverse saturation current of thin film/semiconductor p-n junctions with rise in temperature |
| Module 5 : |
Estimation of leakage current density and quasi-saturation current of metal/insulator/semiconductor (MIS) structures with rise in temperature |
| Module 6 : |
Calculation of rise in photocurrent and plot of current-time curve of a semiconducting thin film by exposing UV lights of various wavelengths |
| Module 7 : |
Measurement of intensity of light by varying input voltage of light emitting diodes |
| Module 8 : |
Measurement of resonant frequency of semiconducting devices operated in microwave range |
| Module 9 : |
Measurement of output current of a solar cell with light intensity and calculation of it efficiency |
| Module 10 : |
Contact angle measurement of water drops on the surface of silicon dioxide, semiconductors, thin films and nanostructures with and without UV treatment |
| Module 11 : |
Quality factor and capacitance measurements of given samples with varying particle size from micro to nanometer |
Course Objective
| 1 . |
To measure electrical properties of a semiconductor
|
| 2 . |
To understand the carrier transportation in semiconductors
|
| 3 . |
To Understand the working mechanism of semiconducting devices |
Course Outcome
| 1 . |
At the end of the course, students will be able to:
|
| 2 . |
CO2: Measure the resistivity and mobility of a given semiconductor |
| 3 . |
CO3: Estimate the leakage current density and quasi-saturation current of metal/insulator/semiconductor (MIS) structures with rise in temperature |
| 4 . |
CO4: Measure the intensity of light by varying input voltage of light emitting diodes |
| 5 . |
CO5: Measure the output current of a solar cell with light intensity and calculate the efficiency |
Essential Reading
| 1 . |
NA, Laboratory Manuals., NA |
Supplementary Reading
| 1 . |
S. A. Campbell, The Science and Engineering of Microelectronic Fabrication, Oxford University Press, 2001 |
Journal and Conferences
| 1 . |