Syllabus

Module-1: Overview of X-ray laboratory instrumentation: Nature of X-Rays, Production of X-Rays, Laboratory X-ray sources, Choice of X-ray Target, Filters, Monochromators, Components and Geometry of an X-Ray Diffractometer, X-ray Detectors, Data Collection Strategies, X-Ray Safety.
Hands on: X-ray Laboratory visit: Instrumentation details and demonstration of experiments, (2+1=3 hours)

Module-2: Crystal Structures: Lattices and the Unit Cell, Crystal Systems and Bravais Lattices, Crystal Structures, Miller Indices.
Practical: Visualization of different Crystal Structures (using different freely available software) and miller indices (using different model) (2+1=3 hours)

Module-3: Introduction to powder diffraction: Bragg law, Single crystal vs powder, Powder Diffraction, Reciprocal lattice, Ewald construction, Scattering by Electrons, Scattering by Atoms and Atomic Scattering Factor, Scattering by Lattices, Calculating the Intensity of diffraction using the Structure Factor Equation, Measured Intensity of diffraction lines in a powder pattern, (Multiplicity, Polarisation Factor, Lorentz Factor, Absorption Factor, Temperature Effects). Information in a powder pattern, Sources of diffraction peak broadening (sample sources (size, strain, defects etc.), instrumental sources), analytical functions for peak description.
Tutorial: Structure Factors and Peak Intensities
Hands-on: Sample preparation of XRD measurements. Measurement of the XRD data some materials with a cubic crystal system
Practical: (1) Indexing the x-ray diffraction pattern and identifying the Bravais lattice of some materials with a cubic crystal system.
(2) Precise determination lattice parameters of some materials with a cubic crystal system from XRD data
(3) Determination of average crystallite size and lattice strain of some materials with a cubic crystal system from x-ray peak broadening analysis (6+4=10 hours)

Module-4: Introduction to microscopy, Method of image formation, Resolution, Magnification, Depth of field, depth of focus, Optical microscopy, Electron vs. light, Interaction of electron with specimen (brief description of secondary electrons, back scattered electrons, Characteristic X-rays, Auger electrons, transmitted electrons), Basic components of electron microscope, Transmission electron microscopy (TEM), Instrumentation, working, Imaging: Basic Principle, Modes of TEM, Bright field and dark field; High resolution TEM
Hands on: TEM Laboratory visit: Instrumentation details and demonstration of experiments, (3+1=4 hours)

Module-5: Fundamentals of Scanning Electron Microscope: Working principle in scanning mode, Instrumentation, modes of operation, working, Field Emission Scanning Electron Microscope (FESEM), Energy Dispersive X-ray Analysis (EDX), Sample Preparation.
Hands on: SEM Laboratory visit: Instrumentation details and demonstration of experiments (3+1=4 hours)

To impart knowledge on
1. Fundamental aspect of X-rays diffraction and electron microscopy

2. Crystal systems and Bravias Lattices for crystalline materials.

3. Use of X-rays for Iindexing the x-ray diffraction pattern, determination lattice parameters, average crystallite size and strain.

4. Working principle of Transmission Transmission electron microscopy (TEM) and Scanning electron microscopy (SEM).

5. TEM and SEM micrographs.

At the end of course, students will be able to:
CO1: Understand the basic theoretical and experimental aspects x-ray diffraction methods.

CO2: Collect the X-ray diffraction data for various materials.

CO3: Iindex the x-ray diffraction pattern, determine the precise lattice parameters, average crystallite size and strain of the materials.

CO4: Understand electron diffraction and the instrumentation of the TEM and SEM.

CO5: Analyze the TEM and SEM micrographs.

C. Suryanarayana and M. Grant Norton, X-Ray Diffraction: A Practical Approach, Springer 2014.

D P. J. Goodhew, J. Humphreys, R. Beanland, , Electron Microscopy and Analysis, CRC Press (2000).

D. B. Williams & C. B. Carter, , Transmission Electron Microscopy: A Text book for Material Science, , Springer; 2nd Edition 2009

V. Pecharsky, P. Zavalij, , Fundamentals of Powder Diffraction and Structural Characterization of Materials,, Kluwer Academic Publishers; 2003

B.D. Cullity S.R. Stock, Elements of X-Ray Diffraction, Pearson Education Limited, 3rd edition, 2014.