National Institute of Technology Rourkela

राष्ट्रीय प्रौद्योगिकी संस्थान राउरकेला

ଜାତୀୟ ପ୍ରଯୁକ୍ତି ପ୍ରତିଷ୍ଠାନ ରାଉରକେଲା

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Syllabus

Course Details

Subject {L-T-P / C} : EE6152 : Pattern Recognition { 3-0-0 / 3}

Subject Nature : Theory

Coordinator : Dipti Patra

Syllabus

Module 1 :

Pattern Recognition: Feature Extraction and classification stages, Different approaches to pattern recognition. Statistical Pattern Recognition : Hypothesis testing, Linear classifiers, Parametric and nonparametric classification techniques, Unsupervised learning and clustering, Syntactic pattern recognition, Fuzzy set Theoretic approach to PR, Applications of PR : Speech and speaker recognition, Character recognition, Scene analysis.

Course Objective

1 .

Provide knowledge of models, methods and tools used to solve regression,
classification, feature selection and density estimation problems

2 .

Provide knowledge of current research topics and issues in Pattern Recognition and
Machine Learning

3 .

Provide hands-on experience in analyzing and developing solutions/algorithms
capable of learning

Course Outcome

1 .

• Explain and compare a variety of pattern classification, structural pattern recognition techniques.
• Apply performance evaluation methods for pattern recognition, and critique comparisons of techniques made in the research literature.
• Apply pattern recognition techniques to real-world problems.
• Implement simple pattern classifiers, classifier combinations, and structural pattern recognizers.

Essential Reading

1 .

Peter E. Hart, Richard O. Duda, David G. Stork, Pattern Classification, Wiley

2 .

Christopher Bishop, Pattern Recognition & Machine Learning, Springer

Supplementary Reading

1 .

T.Y. Young & King-Sun Fu, Handbook of Pattern Recognition & Image Processing, Academic Press

2 .

Peebles, Peyton Z, Probability, Random Variables & Random Signal Principles, McGraw-Hill

Journal and Conferences

2 .

Elsevier Journal on Pattern Recognition

1 .

IEEE Transaction on Pattern Analysis and Machine Intelligence, IEEE conference on Computer Vision & Pattern Recognition