Syllabus

Optical Microscopy and Image analyzer: Understanding of image formation, resolution, numerical aperture, magnification, depth of field and depth of focus of a microscope. Quantitative and phase analysis (inclusion, size distribution etc.).
X-ray diffraction and analysis: Production and properties of X-rays, X-ray diffraction, Structure factor and intensity calculations. Effect of texture, particle size, micro strain on diffraction lines. Indexing of powder photographs. X-rays florescence: basics and applications in materials science.
SEM and FESEM: Principle and applications, Modes of operation, Image formation - plane and fractured surfaces. Microanalysis (EDX, WDS etc.) TEM: Principle and operation. Bright field and dark field images, Sample preparation techniques. Selected area diffraction, Reciprocal lattice and Ewald sphere construction, Indexing of selected area diffraction patterns. Advanced Characterization Techniques: STEM, AFM, Nanoindentation Testing, EELS- Principle and applications.
DTA/DSC-TG: Scope and applications in materials science.

To have an idea about qualitative and quantitative phase analysis of materials

To have an idea about microstructural characterization of materials

To gain knowledge on thermal characterization of materials

To obtain knowledge about structure-property correlation

CO1: To have an idea of X-Ray diffraction as a materials characterization technique
CO2: To learn microstructural characterization of materials using microscopy
CO3: To have an idea of elemental chemical composition analysis using EDS and WDS
CO4: To learn about basic principles and applications of optical and electron microscopy
CO5: To learn various sample preparation techniques of SEM and TEM
CO6: To gain knowledge of thermal analysis techniques

B.D. Cullity, Elements of X-ray Diffraction, Addison-Wesley Publishing Co. Reading, USA

P. J. Goodhew and F. J. Humphreys, Electron Microscopy and Analysis, Taylor and Francis

Robert Speyer, Thermal analysis of materials, CRC Press

C. Suryanarayana and M. Norton, X-ray Diffraction, A Practical Approach, Plenum Press, New York