Syllabus

Fundamentals of crystallography, Structures in metals, Inorganic compounds, Stereographic projection, Reciprocal lattice.
Generation of X-ray, Continuous and characteristics, X-ray absorption, filters, coherent and incoherent scattering, X-ray fluorescence, Auger electrons.
X-ray Diffraction, Bragg’s Law, Laue, Rotating Crystal and Powder Methods, Factors affecting intensity of diffracted beams, Structure factor, Crystal structure determination, Application of commercial software to determine the crystal structure, Determination of crystallite size and lattice strain through XRD technique, Determination of order-disorder transformation, Quantitative analysis, Preferred orientation and texture.
Principles of X-ray fluorescence, Advantages of XRF techniques, ED-XRF and WD-XRF.
Electron Microscopy: Optical microscope, Principle of operation, Abbe’s criteria, Resolution of microscope, Rayleigh’s criteria of resolution, Depth of field and depth of focus, Aberrations, Electrons vs light, Thermionic and field emission sources of electron, Electron interaction with materials, Electron diffraction, Electron microscope, Contrast mechanisms, Elemental analysis through EDS and WDS, SEM: principle of operation, mode of operation. TEM: principle of operation, sample preparation, mode of operation.
Thermal characterization techniques: Theory, Thermo Gravimetric Analysis (TGA), Differential Thermal analysis (DTA), Differential Scanning Calorimetry (DSC), Applications, Dilatometer.
Chemical characterization techniques: Principles, Infrared spectroscopy (IR), Raman spectroscopy.

Understanding of various materials characterization techniques.

1. Application of XRD technique in Metallurgical and Materials Engg.
2. Microstructural characterization using Optical and Electron Microscopes (SEM and TEM).
3. Structural characterization using SEM and TEM.
4. Chemical composition through EDS and WDS.
5. Gaining knowledge on sample preparation for optical and electron microscopy.
6. Application of TG, DTG, DTA, and DSC in metallurgical processes.

B.D. Cullity, Elements of X-ray diffraction, Elements of X-ray diffraction

Peter J. Goodhew, John Humphreys, Electron Microscopy and Analysis, CRC Press