Syllabus

• Crystal systems, symmetry, space groups
• Stereographic projections and pole figures
• X-ray diffraction (XRD):
o Bragg’s law, structure factor, systematic absences
o Phase identification and quantitative phase analysis
o Crystallite size and microstrain (Scherrer, Williamson-Hall)
o Texture analysis
o Residual stress measurement (sin²? method)
• Introduction to neutron and synchrotron diffraction (overview)
• AI-based automated XRD phase identification and analysis
( 6 contact hours)

• Thermodynamics of phase transformations
• Thermal analysis techniques:
o DTA, DSC, TGA - principles and instrumentation
o High-temperature calorimetry
• Kinetics of reactions and phase transitions
• Thermal expansion (Dilatometry, TMA)
• Machine learning prediction of thermal behavior and kinetics
• Case studies:
o Sintering behavior of ceramics
o Decomposition and oxidation mechanisms
( 6 contact hours)

Optical Microscopy
• Light optics, contrast mechanisms
• Polarized light microscopy for ceramics
• Grain size measurement, porosity, phase distribution
• Limitations and artifacts
Scanning Electron Microscopy (SEM)
• Electron-matter interactions
• SEM optics, detectors (SE, BSE)
• Image interpretation and contrast mechanisms
• Deep learning for automated microstructure image analysis
• Analytical SEM:
o EDS/EDX and WDS
o Elemental mapping and quantification
( 6 contact hours)

• Construction and operation of TEM
• Electron diffraction (SAED, CBED)
• Bright-field and dark-field imaging
• High-resolution TEM (HRTEM)
• STEM and HAADF imaging
• Defects: dislocations, twins, grain boundaries
• Sample preparation challenges for ceramics
• AI-assisted defect detection and atomic-scale TEM analysis
( 6 contact hours)

• Infrared (FTIR) spectroscopy:
o Vibrational modes, bonding analysis
• Raman spectroscopy:
o Selection rules, polarization effects
o Phase identification and stress analysis
• UV-Visible spectroscopy
• Introduction to XPS and AES
• Machine learning for spectral analysis and phase identification
( 6 contact hours)

• Atomic Force Microscopy (AFM) and variants
• Nanoindentation and micromechanical testing
• In-situ and operando characterization
• Combined techniques (correlative microscopy)
• AI-driven multimodal data fusion for materials discovery
• Case studies from recent literature in:
o Energy materials
o Electronic ceramics
o Nanostructured systems
( 6 contact hours)

Provide in-depth understanding of structure-property-performance relationships in advanced ceramic and functional materials.

Develop theoretical foundations and practical interpretation skills for major characterization techniques.

Train students to critically analyze diffraction, microscopy, spectroscopy, and thermal data.

Enable selection of appropriate characterization tools for ceramics, nanomaterials, thin films, and composites.

Expose students to advanced and emerging characterization methods relevant to research and industry.

Explain the crystallographic, microstructural, thermal, and spectroscopic principles underlying modern materials characterization techniques.

Interpret and analyze XRD, electron microscopy (SEM/TEM), thermal analysis, and spectroscopic data for ceramic and functional materials.

Correlate microstructure, phases, and defects with the electrical, mechanical, thermal, and optical properties of materials.

Design and critically evaluate characterization strategies and experimental results reported in contemporary materials research literature.

H.H. Willard, L.L. Merritt Jr, J.A. Dean, F.A. Settle Jr., Instrumental methods of analysis. , Wadsworth Publishing Co Inc

B.D. Cullity, Elements of X-ray Diffraction, Pearson College Div

D.B. Williams & C.B. Carter, Transmission Electron Microscopy: A textbook for Materials Science, Springer Nature

J.I. Goldstein, D.E. Newbury, J.R. Michael, N.W.M Ritchie, J.H.J Scott, D.C.Joy, Scanning Electron Microscopy and X-ray Microanalysis, Springer

S.J.B Reed, Electron Microprobe Analysis, Cambridge University Press